Student Thesis Archive

2020s

2024

2023

2022

2021

2020

2010s

2019

2018

2017

2015

2014

2013

2012

2011

2010

2000s

2009

2008

2007

2006

  • Ning, S. Andrew, “Creation of an Intermediate Environment and Utilizing Switchable Microwave Absorbent Material to Aid in Performing Work on Mars,” Advisor: David Allred (Honors Thesis, Aug 2006).

2005

  • Evans, William Ray, “Determining Optical Constants for ThO2 Thin Films Spluttered under Different Bias Voltages from 1.2 to 6.5 eV by Spectroscopic Ellipsometry,” Advisor: David Allred (Honors Thesis, Jan 2005).

2004

  • Acosta, Guillermo Antonio, “Developing a Technique for measuring Thickness of Thin Films, From 5 to 15 Nanometers, Using Atomic Force Microscopy ,” Advisor: David Allred (Masters Thesis, Aug 2004).
  • Adamson, Kristi, “Determining Chemical Composition of Sputtered Uranium Oxide Thin Films through X-Ray Photoelectron Spectroscopy,” Advisor: David Allred (Senior Thesis, Apr 2004).
  • Archer, Paul, “Determining Favorable Conditions for Endolithic Growth: UV Protection and Desiccation Prevention,” Advisor: David Allred (Senior Thesis, Jun 2004).
  • Bissell, Luke, “Determining Ruthenium's Optical Constants in the Spectral Range 11-14 NM,” Advisor: David Allred (Senior Thesis, Aug 2004).
  • Johnson, Jedediah Edward Jensen, “Thorium Based Mirrors for High Reflectivity in the EUV,” Advisor: David Allred (Honors Thesis, Aug 2004).
  • Sandberg, Richard, “Optical Applications of Uranium Thin-Film Compounds for the Extreme Ultraviolet and Soft X-Ray Region,” Advisor: David Allred (Senior Thesis, Aug 2004).

2003

2001

  • Choi, Joseph S., “In Situ Ellipsometry of Surfaces in an Ultrahigh Vacuum Thin Film Deposition Chamber,” Advisor: David Allred (Honors Thesis, Jun 2001).
  • Johnson, Cort, “Developing an Improved Extreme Ultraviolet Filter,” Advisor: David Allred (Senior Thesis, Apr 2001).
  • Squires, Matthew B, “The Measurment (58.4-164.0 nm) and Analysis (40.0- 600.0 nm) of the Atom Scattering Factors of Diamond and Graphite ,” Advisor: David Allred (Masters Thesis, Aug 2001).

1990s

1999

  • Squires, Matthew B., “On Determining the Optical Constants of Sputtered U and a-Si at 304 and 484 Å,” Advisor: David Allred (Honors Thesis, Mar 1999).

1998

  • Brovkin, Pavel Leonidovich, “The Physics of Low-Capacitance JFETs,” Advisor: David Allred (Masters Thesis, Apr 1998).
  • Fennimore, Adam, “Morphology and Oxidation of U/Al and UN/Al Multilayer MIrrors,” Advisor: David Allred (Honors Thesis, Feb 1998).

1996

  • Thompson, Gregory B., “Reactive Gas Sputtering of Lithium Compound Thin Films,” Advisor: David Allred (Senior Thesis, Jun 1996).

1993

  • Cai, Ming, “The Characterization of Mo/Si Soft X-Ray Multilayers by Raman Spectrpscopy and Other Techniques,” Advisor: David Allred (PhD Dissertation, Dec 1993).

1991

  • Davis, Cheryl Barnett, “Deep-Level Photoluminescience of ZNxCd1-xTe,” Advisor: David Allred (Masters Thesis, Dec 1991).
  • Yuan, Fang, “Characterization of Boron Films Prepared by Chemical Vapor Deposition and their Applications in X-Ray Imaging,” Advisor: David Allred (PhD Dissertation, Dec 1991).