Professor David D. Allred
N276 ESC Phone: FAX: E-mail:	801-378-4361 801-378-2265 allred@byu.edu

Department of Physics and Astronomy
Brigham Young University
Provo, UT 84602

EDUCATION AND EXPERIENCE

PhD, Physics and Physical Chemistry, Princeton University (1977), Advisor: Robert A. Nauman

Research Associate and Assistant Professor, Optical Science Center, University of Arizona

Research Scientist and Group Leader, Energy Conversion Devices, Inc., Troy, Michigan.

Founding professor for the Goldhelox project.

RESEARCH INTERESTS

• EUV and Soft X-Ray Multilayer Mirrors
• EUV and Soft X-Ray Sources
• GoldHelox
• Mars Probe
• Hollow Atoms
• Preparation and characterization of thin films, multilayers and nanothin films.
• Chemical Vapor Deposition
• Sputtering
• Thermoelectric materials
• photovoltaic materials
• amorphous semiconductor multilayers
• Raman techniques for probing the interfaces in periodic multilayer structures and multilayers for EUV and soft s-ray reflectors.

Professor Allred has advised three Ph.D. students and two M.S. students in physics.   He has also advised over 25 undergraduate students involved in research, including 5 at the present.

Patents  

Summarized by topic, the patents are:
Solar Energy and Optics: #4,419,533, #4,582,764, #4,702,955, #4,745,000
CVD: #4,435,445, #4,594,973, #4,685,030
Microwave Assisted CVD and Radical Generation: #4,504,518, #4,517,223, #4,615,905, #4,664,937, #4,701,343, #4,745,000
Thermoelectricity: #4,654,224
Hybrid Electronics: #4,685,030
Xerography: #4,745,000
Rare Earth Magnetic Materials: #4,715,891, #4,715,890, #4,753,675
X-ray windows and reflectors: #5,226,067, #5,458,084 #5,485,499

Recent USA patents:

5,226,067, [1993]
5,458,084- "X-ray Wave diffraction optics constructed by atomic layer epitaxy." [1995].
5,485,499- High throughput Reflectivity and resolution x-ray dispersive and reflective structures for the 100 eV to 5000 Ev energy range and method of making the devices," [1996}.

Canadian patents:

1,333,426. "X-ray Wave diffraction optics constructed by atomic layer epitaxy."
 
 
 

PROCEEDINGS EDITED FOR PUBLICATION

2. Modern Perspectives On Thermoelectrics and Related Materials, David D. Allred, Cronin B. Vining, and Glen A. Slack, Editors (Material Research Society, Pittsburgh, PA 1991), a volume in the Material Research Society symposium proceedings: ISBN 0272-9172; Vol. 234. I oversaw the reviewing, editing and preparing for publishing selected papers from the symposium held in Anaheim, CA, May 1-2, 1991.
 

1. Proceedings of the Tenth International Conference on Chemical Vapor Deposition--1987, Proceedings Vol. 87-8, G. W. Cullen and J. M. Blocher, Jr., Editors, Part VIII: CVD for Energy Related Applications, David D. Allred, Subject Editor (The Electrochemical Society, Inc., Pennington, NJ, 1987).
 

Publications:
 

61. G.B. Thompson and D.D. Allred, "Reactive Gas Magnetron Sputtering of Lithium Hydride and Lithium Fluoride Thin Films,"J. X-ray Sci. Technol. 7, 157-170. (1997).
 

60. Steven E. Jones, David S. Shelton, R. Steven Turley, M. Jeanette Lawler and David D. Allred, "Raman spectrographic system for qualitative analysis of isotopic hydrogen mixtures for muon catalysis experiments." Hyperfine Interactions 101/102, 695-698 (1996).
 

59. Gary L. Catchen, William E. Evenson and David Allred, "Structural phase transition and T_c distribution in Hf-doped LaMnO₃ investigated using perturbed-angular-correlation spectroscopy," Phys. Rev. B 54(6), 3679-82 (1996).
 

58. J. Gonzalez-Hernandez, B. S. Chao, S. R. Ovshinsky and D. D. Allred, "The Structure of W/C (0.15< <0.8) Multilayers Annealed in Argon or Air," J. X-ray Sci. Technol. 6(1), 1-31 (1996).
 

57. D. L. Harper, R.G. Albridge, N.H. Tolk, Qi Wang, D.D. Allred and L.V. Knight, "Observation of beam-induced changes in the polarization of Balmer- radiation emitted following beam-tilted-foil transmission," Phys. Rev. A 52(6), 4631-9 (1995).
 

56. Qi Wang, and D.D. Allred, "Deconvolution of the Raman Spectrum of Amorphous Carbon," J. of Raman Spectr. 26, 1039-43 (1995).
 

55. F.Yuan, J. A.Johnson, D. D. Allred and R. H. Todd, "Waterjet cutting of cross linked glass," J. Vac. Sci. Technol. A 13(1), Jan/Feb 1995.
 

54. W.I. Karain, L. V. Knight, D. D. Allred and A. Reyes-Mena, "Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions," J. Vac. Sci. Technol. A 12(4), 2581-85 (1994).
 

53. F. Ruiz, C. Vázquez-López, Jesus González-Hernández, and David D. Allred, G. Romero-Paredes and R. Peña-Sierra and G. Torres-Delgado, "Mesostructure of photoluminescent porous silicon," J. Vac. Sci. Technol. A 12(4), 2565-71 (1994).
 

52. Ming Cai, David D. Allred, and A. Reyes-Mena, "Raman spectroscopic study of the formation of t-MoSi₂ from Mo/Si multilayers," J. Vac. Sci. Technol. A 12(4), 1535-41 (1994).
 

51. W.I. Karain, L. V. Knight, D. D. Allred and A. Reyes-Mena, "The Use of Sharp Silicon Tips as Photocathodes and Electron Sources for X-ray Generation," J. of Nanostructure Materials 3, 419-426 (1993).
 

50. Cheryl Barnett Davis, David D. Allred, A. Reyes-Mena, Jesus González-Hernández, Ovidio Gonzalez, Bret C. Hess, and Worth P. Allred, "Photoluminescence and Absorption studies of Defects in CdTe and Zn_xCd_1-xTe crystals," Phys. Rev. B 47, 13 363-13 369 (1993).
 

49. Qi Wang, D.D. Allred, and Jesus González-Hernández, "The Low-Frequency Feature in First-Order Raman Spectrum of Amorphous Carbon," Phys. Rev. B 47(20), 6119-6121 (1993).
 

48. Ming Cai, Qi Wang, David D. Allred, L.V. Knight, Dorian M. Hatch, A. Reyes-Mena, Jesus González-Hernández, and Guizhong Zhang, "The Use of Raman Spectroscopy in Characterizing Soft X-Ray Multilayers: Tools in Understanding Structure and Interfaces," Optical Materials for High Power Lasers, Brian Newnam, Editor, Proc. SPIE, 1848, 24th Boulder Damage Symposium, Boulder, CO, October 28-30, 1992.
 

47. David D. Allred, Ming Cai, Dorian Hatch, Qi Wang, and A. Reyes-Mena, "Raman Spectroscopic Analysis of Mo/Si Multilayers," J. X-Ray Sci. Technol. 3, 222-228 (1992).
 

46. Douglas P. Hansen, A. Reyes-Mena, John Colton, Larry V. Knight, and David D. Allred, "Multilayer phase diffraction gratings modules as a structure in three dimensions," Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Lithography, Richard B. Hoover and Arthur B. C. Walker, Jr., Editors, Proc. SPIE 1742 (1992).
 

45. W.I. Karain, Larry V. Knight, David D. Allred and A. Reyes-Mena, "X-ray diode using a silicon field emission photocathode," Soft X-Ray Microscopy, Chris J. Jacobsen and James E. Trebes, Editors, Proc. SPIE 1741 (1992).
 

44. W.I. Karain, Larry V. Knight, David D. Allred and A. Reyes-Mena, "Manufacturing of atomically sharp silicon tips and their use as photocathodes," Encyclia 69 257-272 (1992).
 

43. F. Yuan, Y. Shi, L.V. Knight, R.T. Perkins and D.D. Allred, "Using Thin Film Stress to Produce Precision, Figured X-ray Optics," Thin Solid Films, 220, 284-288 (1992).
 

42. J. González-Hernández, B.S. Chao, D.A. Pawlik, D.D. Allred, and Qi Wang, "Characterization of as-prepared and annealed W/C multilayer thin films," J. Vac. Sci. Technol. 10(1), 145-151 (1992).
 

41. Memorie Williams, Evan Hansen, A. Reyes-Mena, and David D. Allred, "The Transmittance of Thin Polymer Films and their Suitability as a Support Substrate for a Soft X-ray Telescope, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, Oswald H. Siegmund and Richard E. Rothschild, Editors, Proc. SPIE 1549, 147-154 (1991).
 

40. B.S. Chao, D.A. Pawlik, J. González-Hernández, Qi Wang, and D.D. Allred, "The effect of oxygen on the structure of annealed W/C multilayer thin films," Solid State Communications 79, 205-207 (1991).
 

39. B.S. Chao, J. González-Hernández, D.A. Pawlik, Qi Wang, and D.D. Allred, "The effect of oxygen on the structure of annealed W/C multilayer thin films," (Mat. Res. Soc. Symp. Proc. Series EA-21, Pittsburgh, PA, (1991), pp. 185-188.
 

38. J. González-Hernández, O. Zelaya, J.G. Mendoza-Alverez, Elías López-Cruz, and D.D. Allred, "Structure and optical characterization of Zn_xCd_1-xTe thin films prepared by the close spaced vapor transport method," J. Vac. Sci. Technol. 9, 550-4 (1991).
 

37. C.M. Egert and D.D. Allred, "Light Absorbing Beryllium Coating Produced by Magnetron Sputtering," Stray Light in Optical Systems, Robert P. Breault, Editor, Proc. SPIE 1331, 170-178 (1990).
 

36. Roland D. Seals, C.M. Egert, and D.D. Allred, "Advanced Infrared Optically Black Baffle Materials," Optical Surfaces Resistant to Severe Environments, Solomon Musikant and Robert P. Breault, Editors, Proc. SPIE 1330, 164-177 (1990).
 

35. J. González-Hernández, Elías López-Cruz, D.D. Allred, and W.P. Allred, "Photoluminescence Studies in Zn_xCd_1-xTe Single Crystals," J. Vac. Sci. Technol. 8, 3255-59 (1990).
 

34. Elías López-Cruz, J. González-Hernández, D.D. Allred and W.P. Allred, "Photoconductivity Characterization of Zn_xCd_1-xTe (0x0.25) Single Crystal Alloys," J. Vac. Sci. Technol. 8, 1934-38 (1990).
 

33. K. Shurtleff, D.D. Allred, R.T. Perkins, and J.M. Thorne, "Deposition of Zinc Selenide by Atomic Layer Epitaxy for Multilayer X-Ray Optics," Properties of II-VI Semiconductors: Bulk Crystals, Epitaxial Films, Quantum Well Structures, and Dilute Magnetic Systems, J.F. Schetzina, F.J. Bartoli, Jr., and H.F. Schaake, Editors, Mat. Res. Soc. Symp. Proc. Series 161, 109-114 (1990).
 

32. J. González-Hernández, A. Reyes-Mena, D.D. Allred, Elías López-Cruz, and W.P. Allred, "Annealing Behavior of Photoluminescence lines in CdTe and Zn_xCd_1-xTe Single Crystals," Properties of II-VI Semiconductors: Bulk Crystals, Epitaxial Films, Quantum Well Structures, and Dilute Magnetic Systems, J.F. Schetzina, F.J. Bartoli, Jr., and H.F. Schaake, Editors, Mat. Res. Soc. Symp. Proc. Series 161, 33-38 (1990).
 

31. D.D. Allred, Wang Qi, and J. González-Hernández, "Characterization of Metal/Carbon Multilayers by Raman Spectroscopy, Layered Structures- Heteroepitaxy, Superlattices, Strain and Metastability, B.W. Dodson, L.J. Schowalter, F.H. Pollak, and J.E. Cunningham, Editors, Mat. Res. Soc. Symp. Proc. Series 160, 605-610 (1990).
 

30. Raymond T. Perkins, David D. Allred, Larry V. Knight, and James M. Thorne, "Design of high-performance, soft x-ray windows," Advances in X-ray Analysis, 33, Charles S. Barrett, Editor (Plenum, New York, 1990), pp. 615-622.
 

29. K. Shurtleff, D.D. Allred, R.T. Perkins, and J.M. Thorne, "Multilayer X-Ray Optics Produced by Atomic Layer Epitaxy," X-Ray/EUV Optics for Astronomy and Microscopy, Richard B. Hoover, Editor, Proc. SPIE 1160, 303-308 (1989).
 

28. Wang Qi, D.D. Allred, L.V. Knight, and J. González-Hernández, "Use of Raman Spectroscopy in the Characterization of Soft X-Ray Multilayer Reflectors," X-Ray/EUV Optics for Astronomy and Microscopy, Richard B. Hoover, Editor, Proc. SPIE 1160, 229-234 (1989).
 

27. R.T. Perkins, D.D. Allred, L.V. Knight, and J.M. Thorne, "Design of High-Performance Soft X-Ray Windows," X-Ray/EUV Optics for Astronomy and Microscopy, Richard B. Hoover, Editor, Proc. SPIE 1160, 56-65 (1989).
 

26. David D. Allred, "Accelerated Life Test for Thermoelectric Junctions: Solder Element Interactions," Proceedings of the Seventh International Conference on Thermoelectric Energy Conversion (Univ. of Texas, Arlington, TX, 1988), pp. 137-140.
 

25. R.F. Edgerton and D.D. Allred, "Comparison of Effective Medium Procedures for Optical Modeling of Laminar Structures," Modeling of Optical Thin Film, M. Jacobson, Editor, Proc. SPIE 821, 167-173 (1988).
 

24. David D. Allred, "CVD of Optical and Energy Related Materials---A Survey," abstract No. 1164, Extended Abstracts 87-2, the 172 nd Meeting of the Electrochemical Society (Electrochemical Society, Pennington, NJ, 1987), p. 1162. Presented at the 10th International Conference on Chemical Vapor Deposition, Honolulu, Hawaii, October 19-23, 1987.
 

23. S.R. Ovshinsky, R.T. Young, David D. Allred, G. DeMaggio, and G.A. Van der Leeden, "Superconductivity at 155 K," Phys. Rev. Lett. 58, 2579-2581 (1987).
 

22. David D. Allred, R. Edgerton, J. González-Hernández and O.V. Nguyen, "Optical and Structural Properties of Heterobasis Amorphous Multilayers," Interfaces, Superlattices and Thin Films, J. D. Dow and I.K. Schuller, Editors, Mat. Res. Soc. Symp. Proc. 77, 567-572 (1987).
 

21. J. González-Hernández, David D. Allred and O.V. Nguyen, "Anneal Induced Changes in Amorphous Semiconductor Multilayers," Interfaces, Superlattices and Thin Films, J. D. Dow and I.K. Schuller, Editors, Mat. Res. Soc. Symp. Proc. 77, 665-670 (1987).
 

20. David D. Allred, J. González-Hernández, O.V. Nguyen, D. Martin, and D. Pawlik, "Raman Scattering and X-Ray Diffraction Characterization of Amorphous Semiconductor Multilayer Interfaces," J. Mat. Res. 1, 468-475 (1986).
 

19. O.V. Nguyen, David D. Allred and S.R. Ovshinsky, "A New Multiphase Thermoelectric Material for Power Generation," Proc. of the Sixth Intern. Conf. on Thermoelectric Energy Conversion (The University of Texas at Arlington, Arlington, Texas, 1986), pp. 157-161.
 

18. J. González-Hernández, David D. Allred, O.V. Nguyen, D. Martin, and D. Pawlik, "Raman Scattering and X-Ray Diffraction Characterization of Amorphous Semiconductor Multilayer Interfaces," Layered Structures and Epitaxy, J.M. Gibson, G.C. Osbourn, and R.T.\ Tromp, Editors, Mat. Res. Soc. Symp. Proc. 56, 389-394 (1986).
 

17. David D. Allred, M.R. Jacobson, and E.E. Chain, "High Temperature Stable Selective Surfaces by Chemical Vapor Deposition," Solar Energy Materials 12, 87-129 (1985) (Review Paper).
 

16. N. Jackett, David D. Allred, T.H. Sein and J.U. Trefny, "Thermal Diffusivity by Modified Angstrom Technique," Proceedings of the Fifth International Conference on Thermoelectric Energy Conversion, (The University of Texas at Arlington, 1984), pp. 116-119.
 

15. David D. Allred and J.A. Piontkowski, "CVD Amorphous Germanium: Preparation and Properties," Proceedings of the 9th International Conference on Chemical Vapor Deposition - CVD - IX, May 6-11, 1984 (Electrochemical Society, Pennington, NJ, 1984), p. 546-557.
 

14. David D. Allred and J.A. Piontkowski, "CVD a-Ge and a-Ge:X Films: Preparation and Properties," Proceedings of the Fourth European Conference on Chemical Vapour Deposition, EURO-CVD-FOUR, (Philips Centre for Manufacturing Technology, Eindhoven, The Netherlands, 1983), p. 197.
 

13. E. Randich and David D. Allred, "Chemically Vapor-Deposited ZrB₂ as a Selective Solar Absorber," Thin Solid Films 83, 393-398 (1981).
 

12. David D. Allred, D.C. Booth, B.R. Appleton, P.D. Miller, C.D. Moak, J.P.F. Sellschop, C.W. White, and A.L. Wintenberg, "The Hydrogen Content of Multicomponent Amorphous Silicon Alloys," IEEE, Transactions on Nuclear Science NS-28, 1838-40 (1981).
 

11. David D. Allred, "Selective Surfaces by Chemical Vapor Deposition," Proceedings of the Second Annual Coating for Solar Collectors Symposium, St. Louis, MO, October 16-17, 1979 (Invited Paper).
 

10. D.C. Booth, David D. Allred, and B.O. Seraphin, "Retarding Crystallization of CVD Amorphous Silicon by Alloying," J. Non-Cryst. Solids 35-36, 213 (1980).
 

9. D.C. Booth, David D. Allred, and B.O. Seraphin, "Stabilized CVD Amorphous Silicon for High Temperature Photothermal Solar Energy Conversion," Solar Energy Mat. 2, 107-124 (1979).
 

8. M. Janai, David D. Allred, D.C. Booth, and B.O. Seraphin, "Optical Properties and Structure of Amorphous Silicon Films Prepared by CVD," Solar Energy Mat. 1, 11 (1979).
 

7. D.C. Booth, M. Janai, G. Weiser, David D. Allred, and B.O. Seraphin, "Chemical Vapor Deposited Amorphous Silicon for Use in Photothermal Conversion," Optics Applied to Solar Energy IV, Proc. SPIE 161, 72-77 (1978).
 

6. G.E. Carver, David D. Allred, and B.O. Seraphin, "Chemical Vapor Deposited Molybdenum for Use in Photothermal Conversion," Optics Applied to Solar Energy IV, Proc. SPIE 161, 66-71 (1978).
 

5. David D. Allred, C.W. White, G.J. Clark, B.R. Appleton, and I.S.T. Tsong, "Measurement of Hydrogen Profiles in SiO₂ by a Nuclear Reaction Technique," The Physics of SiO₂ and its Interfaces, Proc. of the Intern. Topical Conf. on the Physics of SiO₂ and its Interfaces, held at the IBM Watson Research Center, Yorktown Heights, New York, March 22-24, 1978, Sokrates T. Pantelides, Editor (Pergamon Press, New York, 1978), pp. 210-214.
 

4. J.R. Ziegler, C.P. Wu, P. Williams, ....and David D. Allred, "Profiling Hydrogen in Materials Using Ion Beams," Nucl. Instrum. Meth. 149, 19 (1978).
 

3. G.J. White, C.W. White, David D. Allred, B.R. Appleton, F.B. Koch, and C.W. Magee, "The Application of Nuclear Reactions for Quantitative Hydrogen Analysis in a Variety of Different Materials Problems," Nucl. Instrum. Meth. 149, 9 (1978).
 

2. G.J. Clark, C.W. White, David D. Allred, B.R. Appleton, C.W. Magee, and D.E. Carlson, "The use of nuclear reactions and SIMS for quantitative depth profiling of hydrogen in amorphous silicon," Appl. Phys. Lett. 31, 582-585 (1977).
 

1. J.E. Estrel, David D. Allred, J.C. Hardy, R.G. Sextro, and J. Cerny, "-Delayed Proton Decay of ⁹C," Phys. Rev. C 6, 373-375 (1972).

Last modified 12 Nov 1998 by S. D. Bergeson