DAVID D. ALLRED

N265 ESC

Brigham Young University

Provo, UT 84602

(801) 422‑3489

Thursday, January 05, 2012

CURRENT RESEARCH

Thin film deposition & characterization;

Optical properties of materials from 1 to 600 eV range (visible to EUV and soft x-rays)

Space science; special multifunction mirrors for the spacecraft instruments

Mars exploration simulation/development and astrobiology.

EDUCATION

1977 Ph.D., Physics and Physical Chemistry, Princeton University (First combined degree granted between the Departments of Physics and Chemistry in 15 years.) Dissertation: Accurate Eigenvalue Expressions for Central Power Law Potentials with Applications to Nuclear States.

1973 M.S., Chemistry, Princeton University, Princeton, New Jersey

1971 B.S., Chemistry (ACS Certificate), Brigham Young University, Provo, Utah (Summa cum laude, also with highest honors from the Honors Program.)

PERSONAL

EMPLOYMENT HISTORY (since graduate school)

1993 to present Professor, Department of Physics and Astronomy, Brigham Young University

1987‑1993 Associate Professor, Department of Physics and Astronomy, BYU

1980- 1987 Research Scientist & Group Leader, Energy Conversion Devices, Inc. Troy, Michigan

1980 Research Assistant Professor, Optical Sciences Center, University of Arizona, Tucson

1977-79 Research Associate (Solar Energy) Optical Sciences Center, The University of Arizona

1977 National Science Foundation Energy Related Post‑Doctoral Fellowship, Oak Ridge National Laboratory (Appleton/White Solid State group, Ion Beams)

STUDENT THESIS AND DISSERTATIONS: for complete list see below.

Dissertations (Ph.D.) 3 (Allred advisor); Masters 3; Senior and Honors thesis 8
Graduate committees since 2010

GRANTS

Principle investigator for over 20 projects in the areas of EUV mirrors for space application and minority student education using undergraduate research and peer study groups.

RESEARCH PRESENTATIONS: Allred and students (See more complete list below)

2006

2005 43

2004 6+ spring

2003 26

2002 14+spring

CLASSES TAUGHT/ COURSES DEVELOPED

All classes in BYU’s introductory calculus‑based physics series: Namely, mechanics (Physics 121), Electricity and magnetism class (Physics 220), Physics 123, optics, heat, matter, relativity. Physics 222: Modern Physics

General education physical science (PS 100)

Four graduate physics classes developed:

513R- Nanostructures, surfaces and interfaces-taught twice with William Evenson

585- Thin film physics- taught 11 times

711R: Optical processes of semiconductors.

671- X-ray optics- taught five times

History and Philosophy of Science

In the University Honors Program: 201H, 202H and 241H. This is a team taught, two- semester, nine-credit hour, combination history of civilization/science colloquium class.

OTHER PROFESSIONAL EXPERIENCES

Visiting Scientist at CINVESTAV in Mexico (The Centro de investigacion y estudios avanzados del instituto politechnico nacional is the center for advanced scientific and engineering studies for Mexico's second largest university, the national polytechnic institute). The granted was partially funded by CONACYT which is Mexico's version of the National Science Foundation. I was in Mexico in the later half of 1993. Sabbatical work focused on porous silicon and the nontraditional ways to cook tortillas.

Attend six NSF Chautauqua courses for Teachers (see below).

PROFESSIONAL CITIZENSHIP AND INVOLVEMENT

Topical editor for Optical Engineering, 2005-present

Associate editor for the Journal of X ray Science and Technology. 1997-

I referee approximately ten papers for publication each year for J. of Vac. Sci. and Technology, Applied Optics, J. of Applied Physics, J of X-ray Sci. and Technology, Optics Letters and others. I serve on the board of directors of WAESO/Mountain States Alliance of the NSF sponsored WAESO.

I review over 10 faculty-directed undergraduate research proposals each year for WAESO.

MEMBERSHIP IN PROFESSIONAL SOCIETIES

Materials Research Society; American Vacuum Society; SPIE`s soft x-ray working group. And occasionally: UT-ID section of the AAPT (American Association of Physics Teachers); American Physical Society; International Thermoelectric Society; and Phi Kappa Phi

LEADERSHIP

Co-founder of the International Thermoelectric Society

He has been on the boards of directors of two technology companies. Moxtek from 1987 to 1993 and Usertrust (internet privacy, identity and security) from 1999 to the present.

Has served on the board of directors of WAESO/Mountain States Alliance of the NSF sponsored WAESO. Review about 12 faculty directed undergraduate research proposals each year for WAESO.

HONORS

Alcuin Award 1997-2000. This is a three award to an outstanding teacher of general or honors education; Serendipity Award from the Y‑Weekend Committee.

Predoctoral: NSF Post‑doctoral Energy‑Related Fellowship; Woodrow Wilson Fellowship; Eastman Kodak Scientific Award, NSF Pre‑doctoral Fellowship, Kennecott Scholarship; Danforth Foundation Fellowship honorable mention, Marathon Oil Company Cash Award and Four Year Scholarship; National Honor Society Honorary Scholarship

LANGUAGES English, Spanish, German, and Cakchiquel. (Google it.)

PATENTS

Twenty (20) issued USA Patents, including Nos. 4,419,533, 4,435,445, 4,504,518, 4,517,223, 4,582,164, 4,594,973, 4,615,905, 5,226,067, 5,458,084 and 5,485,499; Similar patents were granted in other countries. These are in the areas of x‑ray windows, plasma assisted and photo assisted CVD, amorphous materials, thin films, thermoelectrics, barrier layers and contacts, magnetic materials, hard materials and optical materials.

Recent US patents: 5,226,067, [1993]

5,458,084- “X-ray Wave diffraction optics constructed by atomic layer epitaxy.” [1995].

5,485,499- “High throughput Reflectivity and resolution x-ray dispersive and reflective structures for the 100 eV to 5000 eV energy range and method of making the devices,” [1996].

Most recent Canadian patent is: 1,333,426. “X-ray Wave diffraction optics constructed by atomic layer epitaxy.”

SUMMARY OF PUBLICATIONS

Approximately 80 publications including a review article.

Numerous invited talks and conference presentations.

Seven conference sections organized and chaired.

Co‑organizer of two conferences.

Four short courses given.

Books: Coeditor of two conference proceedings: one on CVD, the other on thermoelectricity.

PROCEEDINGS EDITED FOR PUBLICATION

1. Modern Perspectives On Thermoelectrics and Related Materials, David D. Allred, Cronin B. Vining, and Glen A. Slack, Editors (Material Research Society, Pittsburgh, PA 1991), a volume in the Material Research Society symposium proceedings: ISBN 0272‑9172; Vol. 234. I oversaw the reviewing, editing and preparing for publishing selected papers from the symposium held in Anaheim, CA, May 1‑2, 1991.

2. Proceedings of the Tenth International Conference on Chemical Vapor Deposition‑‑1987, Proceedings Vol. 87‑8, G. W. Cullen and J. M. Blocher, Jr., Editors, Part VIII: CVD for Energy Related Applications, David D. Allred, Subject Editor (The Electrochemical Society, Inc., Pennington, NJ, 1987).

PUBLICATION LIST Undergraduate student authors are underlined. Graduate students with *. Reviewing noted in italics. peer, SO= session organizer reviewed,

2007-11

Lei Pei*, Amy Balls, Cary Tippets, Jonathan Abbott*, Matthew Linford, Jian Hu*, Arun Madan, David Allred, Richard Vanfleet, and Robert Davis, “Polymer Molded Templates for Nanostructured Amorphous Silicon Photovoltaics,” J. Vac. Sci. & Technol. A 29(2), (2011) JVSTA-A-10-228R author proof .
J. A. Brame, J. E. Goodsell, S. A. Getty, Y. Zheng, and D. D. Allred, “Fabrication and Testing of a Strain-Based Carbon Nanotube Magnetometer Structure,” The Journal of the Utah Academy of Sciences, Arts, and Letters-2010, 87, review version, peer
R. Steven Turley, David Allred, Anthony Willey, Joseph Muhlestein, and Zephne Larsen, “Effective Medium Theory, Rough Surfaces, and Moth's Eyes,” The Journal of the Utah Academy of Sciences, Arts, and Letters-2009, 86, 273-286. last draft peer
Nicole Brimhall,* Nicholas Herrick, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross, “Characterization of Optical Constants for Uranium from10 nm to 47 nm,” Applied Optics Vol. 49, Iss. 9, pp. 1581–1585 (2010). peer accepted
Bryan Hicks, Stephanie Getty, and David Allred, "Diode Properties of Nanotube Networks,” Thin Solid Films, 518, 5014-5017 (2010). pdf. accepted.(TSF26908) preprint. peer doi:10.1016/j.tsf.2009.10.155
Nicole Brimhall,* Nicholas Herrick, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross, “Measured Optical Constants of Copper from 10 nm to 35 nm,” Optics Express, Vol. 17 Issue 26, pp.23873-23879 (2009) pdf in review.
Jacqualine Jackson Butterfield and David D. Allred, “Determining the refractive index in the extreme ultraviolet using Kramers-Kronig on thin-film scandium oxide transmission data,” The Journal of the Utah Academy of Sciences, Arts, and Letters-2008, 85, 195-203. galley peer
Elisabeth Strein, David D. Allred, “Eliminating carbon contamination on oxidized Si surfaces using a VUV excimer lamp,” Thin Solid Films, 517 (3), 1011-1015 (2008) final preprint. peer
Elisabeth Strein, David D. Allred, “Eliminating adventitious carbon contamination on SiO₂using a UV excimer lamp,” Annual Technical Conference Proceedings, (Society of Vacuum Coaters, Albuquerque, NM, 2008) 51, 448-452 (2008) rtf preprint. Conference reviewed.
G. Acosta*, R. Vanfleet, D. Allred, and R. S. Turley, “Investigating Subsurface Interfaces of Thin Film Coatings Using Annular Dark Field Scanning Transmission Electron Microscopy,” Annual Technical Conference Proceedings, (Society of Vacuum Coaters, Albuquerque, NM, 2008) 51, 443-447 (2008) pdf preprint. Conference reviewed.
Nicole Brimhall*, Matthew Turner, Nicholas Herrick, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross, “Extreme-ultraviolet polarimeter utilizing laser-generated high-order harmonics,” REVIEW OF SCIENTIFIC INSTRUMENTS 79, (10) 103108-1to7 (2008) Copyright (2008) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in (citation of published article) and may be found at (URL: http://link.aip.org/link/?RSI/79/103108 DOI: 10.1063/1.2999543 or URL/link for published article abstract). article also chosen of : November 2008 issue of Virtual Journal of Ultrafast Science. The Virtual Journal, which is published by the American Physical Society and the American Institute of Physics in cooperation with numerous other societies and publishers, is an edited compilation of links to articles from participating publishers, covering a focused area of frontier research. You can access the Virtual Journal at http://www.vjultrafast.org peer
Johnathan Goodsell, Stephanie A. Getty, Jon Brame, and David D. Allred, “Thin-film iron-catalyzed “beads on a string” carbon nanotubes,” The Journal of the Utah Academy of Sciences, Arts, and Letters-2007, 84, 130-140. Received 2007 Best Paper Award in Physical Sciences Section. (see journal p. iv) Preprint. peer
David D. Allred, “Bounds And Conditions, A Kolob In Our Solar System?” Sunstone, March 2007, pp. 58.61. Final version. solicited article.
Jon Brame, Stephanie Getty, Johnathan Goodsell, and David Dean Allred, “Strain-based Electrical Properties of Systems of Carbon Nanotubes Embedded in Parylene,” in Nanowires and Carbon Nanotubes — Science and Applications, edited by P. Bandaru, M. Endo, I.A. Kinloch, A.M. Rao (Mater. Res. Soc. Symp. Proc. 963E, Warrendale, PA, 2007), paper # 0893-JJ05-09 @ . (Electronic papers only - No book published) preprint: word. pdf. peer

2006 and before.

1. Srinivasan Kannan*, Craig Taylor, David Allred, “PECVD growth of Six:Ge1-x films for high speed devices and MEMS,” Journal of Non-Crystalline Solids, 352, 1272-1274 (2006) SO or peer.

2. William R. Evans, Sarah C. Barton, Michael Clemens and David D. Allred, “Understanding DC-Bias Sputtered Thorium Oxide Thin Films Useful in EUV Optics [6317-37],” in: Advances In X-Ray/EUV Optics, Components, And Applications, edited by Ali M. Khounsary, and Christian Morawe, Proceedings of SPIE, 6317, 631711-1 to 8 (2006). draft; pdf. SO

3. Nicole F. Brimhall, Amy B. Grigg, R. Steven Turley, and David D. Allred, “Thorium-based mirrors in the extreme ultraviolet,” [6317-36] in: Advances In X-Ray/EUV Optics, Components, And Applications, edited by Ali M. Khounsary, and Christian Morawe, Proceedings of SPIE, 6317, 631710-1 to 8 (2006) preprint. SO

4. Donovan Chipman, Andrew Ning, and David Allred, “Intermediate Martian Atmospheric Study and Demonstration,” edited by (American Institute of Aeronautics and Astronautics, 2006) preprint.

5. William R. Evans and David D. Allred, “Determining Indicies of Refraction for ThO₂ Thin Films Sputtered under Different Bias Voltages from 1.2 to 6.5 eV by Spectroscopic Ellipsometry,” Thin Solid Films Volume 515, Issue 3 , 23 November 2006, Pages 847-853. Preprint. pdf peer

6. D. D. Allred, G. A. Acosta*, N. Farnsworth-Brimhall, and R. S. Turley, “Simultaneous Reflection and Transmission Measurements from Coated Diodes to Determine the Optical Constants of Thin Films in the Extreme Ultraviolet,” 49^th Annual Technical Conference Proceedings, Washington, DC, April 22-27, 2006, Vol. 49, (Society of Vacuum Coaters, Albuquerque, NM, 2006) 314-318. ISSN 0737-5921. Conference reviewed.

7. Kristi Adamson, Shannon Lunt*, Richard Sandberg, Elke Jackson, David Allred, R. Steven Turley , “Determining Composition of Thin Films of Uranium Oxide by X-Ray Photoelectron Spectroscopy,” The Journal of the Utah Academy of Sciences, Arts, and Letters-2005, 82, 176-186. Preprint. peer

8. Jed E. Johnson, David D. Allred, R. Steven Turley, William R. Evans, and Richard L. Sandberg, “Thorium-Based Thin Films as Highly Reflective Mirrors in the EUV,” in Actinides—Basic Science, Applications, and Technology, edited by Sarrao, A. Schwartz, M. Antonio, P. Burns, R. Haire, H. Nitsche (Mater. Res. Soc. Symp. Proc. 893, Warrendale, PA, 2006), 207-214; paper # 0893-JJ05-09 @ http://www.mrs.org/s_mrs/sec_subscribe.asp?CID=6210&DID=167961 . SO preprint: word. pdf.

9. Guillermo Acosta*, David D. Allred, and Robert C. Davis, “A Technique for Measuring the Thin Film Thickness of Ultrathin Metallic Thin Films, 4-20 nm, using Atomic Force Microscopy,” in The 48th SVC Technical Conference, in Denver, CO, Vol. 48, edited by Don Maddox, April 23-28, 2005 (Society of Vacuum Coaters, Albuquerque, NM, 2005) 707-713.

Also as: Guillermo Acosta*, David D. Allred, and Robert C. Davis, “A Technique for Measuring the Thin Film Thickness of Ultrathin Metallic Thin Films, 4-20 nm, using Atomic Force Microscopy,” a feature article as published in the 2005 Summer News Bulletin of the Society of Vacuum Coaters. pp 34-38. (Paper solicited for journal but not peer reviewed.) http://www.svc.org/AboutSVC/News/NBS05.pdf

10. David D. Allred, “Mars Jars,” Proceedings from the International Mars Society Conference: 1999-2002, Frank Cross editor. Preprint pdf & the pictures are in this file. Powerpoint presentation ppt; pdf of ppt;

11. R.E. Robinson, R.L. Sandberg, D.D. Allred, A.L. Jackson, J.E. Johnson, W. Evans, T. Doughty, A.E. Baker, K Adamson, and A. Jacquier, “Removing Surface Contaminants from Silicon Wafers to Facilitate EUV Optical Characterization,” 47^th Annual Technical Conference Proceedings, Dallas Texas, April 24-29, 2004, Vol. 47, (Society of Vacuum Coaters, Albuquerque, NM, 2004) 368-376.

12. L. J. Bissell, D. D. Allred, R. S. Turley, W. R. Evans, J. E. Johnson, “Determining Ruthenium's Optical Constants in the Spectral Range 11-14 nm,” in Optical Constants of Materials for UV to X-Ray Wavelengths,” edited by Regina Soufli, and John F. Seely, Proceedings of SPIE, Vol. 5538, (SPIE, Bellingham, WA, 2004) 84-91. word SO

13. Richard L. Sandberg, David D. Allred, Shannon Lunt, Marie K. Urry, R. Steven Turley, “Optical Properties and Application of Uranium-based Thin Films for the Extreme Ultraviolet and Soft X-ray Region,” in Optical Constants of Materials for UV to X-Ray Wavelengths,” edited by Regina Soufli, and John F. Seely, Proceedings of SPIE, Vol. 5538, (SPIE, Bellingham, WA, 2004) 107-118. word SO

14. Richard L. Sandberg, David D. Allred, Luke J. Bissell, Jed E. Johnson, R. Steven Turley, “Uranium Oxide as a Highly Reflective Coating from 100-400 eV,” in Synchrotron Radiation Instrumentation: Eighth International Conference on Synchrotron Radiation Instrumentation, San Francisco, California, 25-29 August 2003, AIP conference proceedings, ISSN: 0094-243X; v. 705, edited by Tony Warwick, et al. (American Institute of Physics, Melville, N.Y., 2004) pp. 796-799. word pdf. peer

15. R. L. Sandberg, D. D. Allred, J. E. Johnson, R. S. Turley, “A comparison of uranium oxide and nickel as single-layer reflectors from 2.7 to 11.6 nm,” in Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications, edited by Ali M. Khounsary, Udo Dinger, Kazuya Ota, Proceedings of SPIE Vol. 5193 (SPIE, Bellingham, WA, 2004) 191-203. SO word

16. David D. Allred, “What the Universe Means to People Like Me,” Dialogue: A Journal of Mormon Thought, 36(1), Spring 2003. solicited article.

17. David D. Allred, Matthew B. Squires, R. Steven Turley, Webster Cash, and Ann Shipley, “Highly Reflective Uranium Mirrors for Astrophysics Applications,” in X-ray Mirrors, Crystals and Multilayers, Andreas K. Freund, Albert T. Macrander, Tetsuya Ishikawa, and James. T. Wood, Editors, Proc. SPIE 4782 , pp 212-223 , SPIE, Bellingham, WA, 2003. SO html preprint

18. M. B. Squires, David D. Allred and R. Steven Turley, “The Optical Constants of Sputtered U and a Si at 30.4 and 58.4 nm,” J. of the Utah Academy of Arts, Sciences and Letters-1999, 76, 74-87 (2002). Word (version without figures.) peer

19. Shannon Lunt, R. Steven Turley, David D. Allred, “Design of Bifunctional XUV Multilayer Mirrors Using a Genetic Algorithm,” J. X-Ray Science and Technology, 9(1), 1-11 (2001). Alternate version word peer

20. B. R. Sandel, A. L. Broadfoot, J. Chen, C. C. Curtis, R. A. King, T. C. Stone, R. H. Hill, J. Chen, O. H. W. Sigmund, R. Raffanti, David D. Allred, R. Steven Turley, D. L. Gallagher, “The Extreme Ultraviolet Imager Investigation for the IMAGE Mission,” Space Science Reviews 91, 197-242 (2000). abstract peer

21. D.D. Allred, R. S. Turley, M. B. Squires, “Dual-function EUV multilayer mirrors for the IMAGE mission,” in EUV, X-Ray and Neutron Optics and Courses, Carolyn A. Macdonald, Kenneth A. Goldberg, Juan R. Maldonado, H. Heather Chen-Mayer, Stephen P. Vernon, Editors, Proceedings of SPIE Vol. 3767, 280-287 (1999). SO pdf Text only.peer

22. Osorio-Saucedo R, Vazquez-Lopez G, Calleja W, Allred DD, Falcony C, “Rotating electrochemical cell to prepare porous silicon with different surface structures,” Thin Solid Films, 338 (1-2), 100-104 (JAN 29 1999). pdf peer

23. Matthew B. Squires, David D. Allred, R. Steven Turley, “The Optical Constants of Sputtered U and a-Si at 30.4 and 58.4 nm,” in EUV, X-Ray and Neutron Optics and Courses, Carolyn A. Macdonald, Kenneth A. Goldberg, Juan R. Maldonado, H. Heather Chen-Mayer, Stephen P. Vernon, Editors, Proceedings of SPIE Vol. 3767, 288-294 (1999). SO pdf rtf version

24. G.B. Thompson and D.D. Allred, “Reactive Gas Magnetron Sputtering of Lithium Hydride and Lithium Fluoride Thin Films,” J. X-ray Sci. Technol. 7, 157-170. (1997). pdf peer

25. Steven E. Jones, David S. Shelton, R. Steven Turley, M. Jeanette Lawler and David D. Allred, “Raman spectrographic system for qualitative analysis of isotopic hydrogen mixtures for muon catalysis experiments,” Hyperfine Interactions 101/102, 695-698 (1996). peer

26. Gary L. Catchen, William E. Evenson and David Allred, “Structural phase transition and T_c distribution in Hf-doped LaMnO₃ investigated using perturbed-angular-correlation spectroscopy,” Phys. Rev. B 54(6), 3679-82 (1996). peer

27. J. Gonzalez-Hernandez, B. S. Chao, S. R. Ovshinsky and D. D. Allred, “The Structure of W/C (0.15< <0.8) Multilayers Annealed in Argon or Air,” J. X-ray Sci. Technol. 6(1), 1-31 (1996). peer

28. D. L. Harper, R.G. Albridge, N.H. Tolk, Qi Wang, D.D. Allred and L.V. Knight, “Observation of beam-induced changes in the polarization of Balmer-α radiation emitted following beam-tilted-foil transmission,” Phys. Rev. A 52(6), 4631-9 (1995). peer

29. Qi Wang, and D.D. Allred, “Deconvolution of the Raman Spectrum of Amorphous Carbon,” J. of Raman Spectr. 26, 1039-43 (1995). peer

30. F. Yuan, J. A. Johnson, D. D. Allred and R. H. Todd, “Waterjet cutting of cross linked glass,” J. Vac. Sci. Technol. A 13(1), Jan/Feb 1995. peer

31. W.I. Karain, L. V. Knight, D. D. Allred and A. Reyes‑Mena, “Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions,” J. Vac. Sci. Technol. A 12(4), 2581‑85 (1994). peer

32. F. Ruiz, C. Vázquez‑López, Jesus González‑Hernández, and David D. Allred, G. Romero‑Paredes and R. Peña‑Sierra and G. Torres‑Delgado, “Mesostructure of photoluminescent porous silicon,” J. Vac. Sci. Technol. A 12(4), 2565‑71 (1994). peer

33. Ming Cai, David D. Allred, and A. Reyes‑Mena, “Raman spectroscopic study of the formation of t‑MoSi₂ from Mo/Si multilayers,” J. Vac. Sci. Technol. A 12(4), 1535‑41 (1994). peer

34. W.I. Karain, L. V. Knight, D. D. Allred and A. Reyes‑Mena, “The Use of Sharp Silicon Tips as Photocathodes and Electron Sources for X‑ray Generation,” Nanostructure Materials 3, 419‑426 (1993). (ISBN 0965-9773. Pergamon on web Elsevier Science Direct) peer

35. Cheryl Barnett Davis, David D. Allred, A. Reyes‑Mena, Jesus González‑Hernández, Ovidio Gonzalez, Bret C. Hess, and Worth P. Allred, “Photoluminescence and Absorption studies of Defects in CdTe and Zn_xCd_1‑xTe crystals,” Phys. Rev. B 47, 13 363‑13 369 (1993). peer

36. Qi Wang, D.D. Allred, and Jesus González‑Hernández, “The Low‑Frequency Feature in First‑Order Raman Spectrum of Amorphous Carbon,” Phys. Rev. B 47(20), 6119‑6121 (1993). peer

37. Ming Cai, Qi Wang, David D. Allred, L.V. Knight, Dorian M. Hatch, A. Reyes‑Mena, Jesus González‑Hernández, and Guizhong Zhang, “The Use of Raman Spectroscopy in Characterizing Soft X‑Ray Multilayers: Tools in Understanding Structure and Interfaces,” Optical Materials for High Power Lasers, Brian Newnam, Editor, Proc. SPIE, 1848, 24th Boulder Damage Symposium, Boulder, CO, October 28‑30, 1992. SO

38. David D. Allred, Ming Cai, Dorian Hatch, Qi Wang, and A. Reyes‑Mena, “Raman Spectroscopic Analysis of Mo/Si Multilayers,” J. X‑Ray Sci. Technol. 3, 222‑228 (1992). pdf peer

39. Douglas P. Hansen, A. Reyes‑Mena, John Colton, Larry V. Knight, and David D. Allred, “Multilayer phase diffraction gratings modules as a structure in three dimensions,” Multilayer and Grazing Incidence X‑Ray/EUV Optics for Astronomy and Lithography, Richard B. Hoover and Arthur B. C. Walker, Jr., Editors, Proc. SPIE 1742 (1992). SO

40. W.I. Karain, Larry V. Knight, David D. Allred and A. Reyes‑Mena, “X‑ray diode using a silicon field emission photocathode,” Soft X‑Ray Microscopy, Chris J. Jacobsen and James E. Trebes, Editors, Proc. SPIE 1741 (1992), 12-18. SO

41. W.I. Karain, Larry V. Knight, David D. Allred and A. Reyes‑Mena, “Manufacturing of atomically sharp silicon tips and their use as photocathodes,” Encyclia 69 257‑272 (1992). peer

42. F. Yuan, Y. Shi, L.V. Knight, R.T. Perkins and D.D. Allred, “Using Thin Film Stress to Produce Precision, Figured X‑ray Optics,” Thin Solid Films, 220, 284‑288 (1992). Abstr. peer

43. J. González‑Hernández, B.S. Chao, D.A. Pawlik, D.D. Allred, and Qi Wang, “Characterization of as‑prepared and annealed W/C multilayer thin films,” J. Vac. Sci. Technol. 10(1), 145‑151 (1992). peer

44. Memorie Williams, Evan Hansen, A. Reyes‑Mena, and David D. Allred, “The Transmittance of Thin Polymer Films and their Suitability as a Support Substrate for a Soft X‑ray Telescope, EUV, X‑Ray, and Gamma‑Ray Instrumentation for Astronomy II, Oswald H. Siegmund and Richard E. Rothschild, Editors, Proc. SPIE 1549, 147‑154 (1991). SO

45. B.S. Chao, D.A. Pawlik, J. González‑Hernández, Qi Wang, and D.D. Allred, “The effect of oxygen on the structure of annealed W/C multilayer thin films,” Solid State Communications 79, 205‑207 (1991). Abstr. peer

46. B.S. Chao, J. González‑Hernández, D.A. Pawlik, Qi Wang, and D.D. Allred, “The effect of oxygen on the structure of annealed W/C multilayer thin films,” (Mat. Res. Soc. Symp. Proc. Series EA‑21, Pittsburgh, PA, (1991), pp. 185‑188. pdf

47. J. González‑Hernández, O. Zelaya, J.G. Mendoza‑Alverez, Elías López‑Cruz, and D.D. Allred, “Structure and optical characterization of Zn_xCd_1-xTe thin films prepared by the close spaced vapor transport method,” J. Vac. Sci. Technol. 9, 550‑4 (1991). peer

48. C.M. Egert and D.D. Allred, “Light Absorbing Beryllium Coating Produced by Magnetron Sputtering,” Stray Light in Optical Systems, Robert P. Breault, Editor, Proc. SPIE 1331, 170‑178 (1990). SO

49. Roland D. Seals, C.M. Egert, and D.D. Allred, “Advanced Infrared Optically Black Baffle Materials,” Optical Surfaces Resistant to Severe Environments, Solomon Musikant and Robert P. Breault, Editors, Proc. SPIE 1330, 164‑177 (1990). SO

50. J. González‑Hernández, Elías López‑Cruz, D.D. Allred, and W.P. Allred, “Photoluminescence Studies in Zn_xCd_1-xTe Single Crystals,” J. Vac. Sci. Technol. 8, 3255‑59 (1990). peer

51. Elías López‑Cruz, J. González‑Hernández, D.D. Allred and W.P. Allred, “Photoconductivity Characterization of Zn_xCd_1-xTe (0#x#0.25) Single Crystal Alloys,” J. Vac. Sci. Technol. 8, 1934‑38 (1990). peer

52. K. Shurtleff, D.D. Allred, R.T. Perkins, and J.M. Thorne, “Deposition of Zinc Selenide by Atomic Layer Epitaxy for Multilayer X‑Ray Optics,” in Properties of II‑VI Semiconductors: Bulk Crystals, Epitaxial Films, Quantum Well Structures, and Dilute Magnetic Systems, J.F. Schetzina, F.J. Bartoli, Jr., and H.F. Schaake, Editors, Mat. Res. Soc. Symp. Proc. Series 161, 109‑114 (1990). SO

53. J. González‑Hernández, A. Reyes‑Mena, D.D. Allred, Elías López‑Cruz, and W.P. Allred, “Annealing Behavior of Photoluminescence lines in CdTe and Zn_xCd_1‑xTe Single Crystals,” in Properties of II‑VI Semiconductors: Bulk Crystals, Epitaxial Films, Quantum Well Structures, and Dilute Magnetic Systems, J.F. Schetzina, F.J. Bartoli, Jr., and H.F. Schaake, Editors, Mat. Res. Soc. Symp. Proc. Series 161, 33‑38 (1990). SO

54. D.D. Allred, Wang Qi, and J. González‑Hernández, “Characterization of Metal/Carbon Multilayers by Raman Spectroscopy,” Layered Structures‑ Heteroepitaxy, Superlattices, Strain and Metastability, B.W. Dodson, L.J. Schowalter, F.H. Pollak, and J.E. Cunningham, Editors, Mat. Res. Soc. Symp. Proc. Series 160, 605‑610 (1990). SO

55. Raymond T. Perkins, David D. Allred, Larry V. Knight, and James M. Thorne, “Design of high‑performance, soft x‑ray windows,” Advances in X‑ray Analysis, 33, Charles S. Barrett, Editor (Plenum, New York, 1990), pp. 615‑622. pdf peer

56. K. Shurtleff, D.D. Allred, R.T. Perkins, and J.M. Thorne, “Multilayer X‑Ray Optics Produced by Atomic Layer Epitaxy,” X‑Ray/EUV Optics for Astronomy and Microscopy, Richard B. Hoover, Editor, Proc. SPIE 1160, 303‑308 (1989). pdf SO

57. Wang Qi, D.D. Allred, L.V. Knight, and J. González‑Hernández, “Use of Raman Spectroscopy in the Characterization of Soft X‑Ray Multilayer Reflectors,” X‑Ray/EUV Optics for Astronomy and Microscopy, Richard B. Hoover, Editor, Proc. SPIE 1160, 229‑234 (1989). pdf SO

58. R.T. Perkins, D.D. Allred, L.V. Knight, and J.M. Thorne, “Design of High‑Performance Soft X‑Ray Windows,” X‑Ray/EUV Optics for Astronomy and Microscopy, Richard B. Hoover, Editor, Proc. SPIE 1160, 56‑65 (1989). pdf SO

59. David D. Allred, “Accelerated Life Test for Thermoelectric Junctions: Solder Element Interactions,” Proceedings of the Seventh International Conference on Thermoelectric Energy Conversion (Univ. of Texas, Arlington, TX, 1988), pp. 137‑140. pdf

60. R.F. Edgerton and D.D. Allred, “Comparison of Effective Medium Procedures for Optical Modeling of Laminar Structures,” Modeling of Optical Thin Film, M. Jacobson, Editor, Proc. SPIE 821, 167‑173 (1988). SO

61. David D. Allred, “CVD of Optical and Energy Related Materials‑‑‑A Survey,” abstract No. 1164, Extended Abstracts 87‑2, the172nd Meeting of the Electrochemical Society (Electrochemical Society, Pennington, NJ, 1987), p. 1162. Presented at the 10th International Conference on Chemical Vapor Deposition, Honolulu, Hawaii, October 19‑23, 1987. pdf SO

62. S.R. Ovshinsky, R.T. Young, David D. Allred, G. DeMaggio, and G.A. Van der Leeden, “Superconductivity at 155 K,” Phys. Rev. Lett. 58, 2579‑2581 (1987). pdf peer

63. David D. Allred, R. Edgerton, J. González‑Hernández and O.V. Nguyen, “Optical and Structural Properties of Heterobasis Amorphous Multilayers,” Interfaces, Superlattices and Thin Films, J. D. Dow and I.K. Schuller, Editors, Mat. Res. Soc. Symp. Proc. 77, 567‑572 (1987). SO

64. J. González‑Hernández, David D. Allred and O.V. Nguyen, “Anneal Induced Changes in Amorphous Semiconductor Multilayers,” Interfaces, Superlattices and Thin Films, J. D. Dow and I.K. Schuller, Editors, Mat. Res. Soc. Symp. Proc. 77, 665‑670 (1987). SO

65. David D. Allred, J. González‑Hernández, O.V. Nguyen, D. Martin, and D. Pawlik, “Raman Scattering and X‑Ray Diffraction Characterization of Amorphous Semiconductor Multilayer Interfaces,” J. Mat. Res. 1, 468‑475 (1986). pdf peer

66. O.V. Nguyen, David D. Allred and S.R. Ovshinsky, “A New Multiphase Thermoelectric Material for Power Generation,” Proc. of the Sixth Intern. Conf. on Thermoelectric Energy Conversion (The University of Texas at Arlington, Arlington, Texas, 1986), pp. 157‑161.

67. J. González‑Hernández, David D. Allred, O.V. Nguyen, D. Martin, and D. Pawlik, “Raman Scattering and X‑Ray Diffraction Characterization of Amorphous Semiconductor Multilayer Interfaces,” Layered Structures and Epitaxy, J.M. Gibson, G.C. Osbourn, and R.T. Tromp, Editors, Mat. Res. Soc. Symp. Proc. 56, 389‑394 (1986). SO

68. David D. Allred, M.R. Jacobson, and E.E. Chain, “High Temperature Stable Selective Surfaces by Chemical Vapor Deposition,” Solar Energy Materials 12, 87‑129 (1985) (Review Paper). peer

69. N. Jackett, David D. Allred, T.H. Sein and J.U. Trefny, “Thermal Diffusivity by Modified Angstrom Technique,” Proceedings of the Fifth International Conference on Thermoelectric Energy Conversion, (The University of Texas at Arlington, 1984), pp. 116‑119.

70. David D. Allred and J.A. Piontkowski, “CVD Amorphous Germanium: Preparation and Properties,” Proceedings of the 9th International Conference on Chemical Vapor Deposition ‑ CVD ‑ IX, May 6‑11, 1984 (Electrochemical Society, Pennington, NJ, 1984), p. 546‑557. SO

71. David D. Allred and J.A. Piontkowski, “CVD a‑Ge and a‑Ge:X Films: Preparation and Properties,” Proceedings of the Fourth European Conference on Chemical Vapour Deposition, EURO‑CVD‑FOUR, (Philips Centre for Manufacturing Technology, Eindhoven, The Netherlands, 1983), p. 197. SO

72. E. Randich and David D. Allred, “Chemically Vapor‑Deposited ZrB₂ as a Selective Solar Absorber,” Thin Solid Films 83, 393‑398 (1981). peer

73. David D. Allred, D.C. Booth, B.R. Appleton, P.D. Miller, C.D. Moak, J.P.F. Sellschop, C.W. White, and A.L. Wintenberg, “The Hydrogen Content of Multicomponent Amorphous Silicon Alloys,” IEEE, Transactions on Nuclear Science NS‑28, 1838‑40 (1981).

peer

74. David D. Allred, “Selective Surfaces by Chemical Vapor Deposition,” Proceedings of the Second Annual Coating for Solar Collectors Symposium, St. Louis, MO, October 16‑17, 1979 (Invited Paper). SO

75. D.C. Booth, David D. Allred, and B.O. Seraphin, “Retarding Crystallization of CVD Amorphous Silicon by Alloying,” J. Non‑Cryst. Solids 35‑36, 213 (1980). peer

76. D.C. Booth, David D. Allred, and B.O. Seraphin, “Stabilized CVD Amorphous Silicon for High Temperature Photothermal Solar Energy Conversion,” Solar Energy Mat. 2, 107‑124 (1979). peer

77. M. Janai, David D. Allred, D.C. Booth, and B.O. Seraphin, “Optical Properties and Structure of Amorphous Silicon Films Prepared by CVD,” Solar Energy Mat. 1, 11 (1979). peer

78. D.C. Booth, M. Janai, G. Weiser, David D. Allred, and B.O. Seraphin, “Chemical Vapor Deposited Amorphous Silicon for Use in Photothermal Conversion,” Optics Applied to Solar Energy IV, Proc. SPIE 161, 72‑77 (1978). SO

79. G.E. Carver, David D. Allred, and B.O. Seraphin, “Chemical Vapor Deposited Molybdenum for Use in Photothermal Conversion,” Optics Applied to Solar Energy IV, Proc. SPIE 161, 66‑71 (1978). SO

80. David D. Allred, C.W. White, G.J. Clark, B.R. Appleton, and I.S.T. Tsong, “Measurement of Hydrogen Profiles in SiO₂ by a Nuclear Reaction Technique,” The Physics of SiO₂ and its Interfaces, Proc. of the Intern. Topical Conf. on the Physics of SiO₂ and its Interfaces, held at the IBM Watson Research Center, Yorktown Heights, New York, March 22‑24, 1978, Sokrates T. Pantelides, Editor (Pergamon Press, New York, 1978), pp. 210‑214. peer

81. J.R. Ziegler, C.P. Wu, P. Williams, ....and David D. Allred, “Profiling Hydrogen in Materials Using Ion Beams,” Nucl. Instrum. Meth. 149, 19 (1978). peer

82. G.J. White, C.W. White, David D. Allred, B.R. Appleton, F.B. Koch, and C.W. Magee, “The Application of Nuclear Reactions for Quantitative Hydrogen Analysis in a Variety of Different Materials Problems,” Nucl. Instrum. Meth. 149, 9 (1978). peer

83. G.J. Clark, C.W. White, David D. Allred, B.R. Appleton, C.W. Magee, and D.E. Carlson, “The use of nuclear reactions and SIMS for quantitative depth profiling of hydrogen in amorphous silicon,” Appl. Phys. Lett. 31, 582‑585 (1977). pdf peer

84. J.E. Estrel, David D. Allred, J.C. Hardy, R.G. Sextro, and J. Cerny, “β‑Delayed Proton Decay of ⁹C,” Phys. Rev. C 6, 373‑375 (1972). pdf peer

Links to other publications of BYU XUV group

Elise Martin and R. Steven Turley, “Modeling the Effects of Surface R on Thin-Film Reflectance Roughness,” the Journal of the Utah Academy of Sciences, Arts, and Letters-2007 peer
N. Brimhall, J.C Painter, M. Turner, S.V. Voronov, R. S. Turley, M. Ware, and J. Peatross, “Construction of an Extreme Ultraviolet Polarimeter Based on High-Order Harmonic Generation,” [6317-34], in: Advances In X-Ray/EUV Optics, Components, And Applications, edited by Ali M. Khounsary, and Christian Morawe, Proceedings of SPIE, 6317, 63170Y-1 to 7 (2006). pdf SO
Amy Grigg, Kristi Adamson, Jed Johnson, Niki Farnsworth, and R. Steven Turley, “X-Ray Photoelectron Spectroscopy to Examine Molecular Composition,” The Journal of the Utah Academy of Sciences, Arts, and Letters-2004, 81, 213-221. peer

Student Thesis and Dissertations. (DOS copies are available on some from allred@byu.edu)

Dissertations (Ph.D.) * signifies Allred was co advisor. Name may not be on thesis.

Name Date Title

Guillermo Acosta Dec. 2007 Scandium Oxide Thin Films and their Optical Properties in the Extreme Ultraviolet pdf.

Douglas P. Hansen* Aug. 1997 Fabrication, Measurement, and Analysis of Multilayer X-ray Diffraction Gratings

Ping Hu* Sept. 1994 Theoretical Study on Domain Structure and Domain Walls in Phase Transition of LaAg_xIn_1-x

Kevin Shurtleff* June 1994 Atomic Layer Epitaxy for the Production of Multilayer X-ray Mirrors (Dep’t. of Chemistry)

Ming Cai Dec. 1993 The Raman Characterization of Silicon‑Containing, Soft X‑ray Multilayers

Fang Yuan Nov. 1991 Characterization of Boron Films Prepared by Chemical Vapor Deposition and their Applications in X-Ray Imaging

Qi Wang Dec. 1990 Raman Study of Amorphous Carbon

Theses (Masters)

Nichole F. Brimhall July 2007 Extreme Ultraviolet Polarimetry with Laser-Generated High-Order Harmonics pdf (reader)

Jedediah Edward Jensen Johnson Dec. 2006 Computationally Modeling the Effects of Surface Roughness on Soft X-Ray Multilayer Reflectors, (Allred reader)

Srinivasan Kannan*, July 2005 PECVD Growth Of Si_x:Ge₁_-xFilms For High Speed Devices And MEMS, At the Dept. of Physics and Astronomy, University of Utah, P. Craig Taylor, advisor (Allred reader)

Guillermo A. Acosta Aug 2004 Developing a Technique for Measuring Thickness of Thin Films from 5 to 15 Nanometers, Using Atomic Force Microscopy

Shannon Lunt* Aug. 2002 Determining the Indices of Refraction of Reactively Sputtered Uranium Dioxide Thin Films From 46 to 584 Angstroms

Matthew Squires Aug. 2001 The Measurement (58.4-164.0 nm) and Analysis (40.0-600.0 nm) of the Atomic Scattering Factors of Diamond and Graphite

David P. Balogh* April 2001 Student Attitudes and Performance in an Online General Education Physical Science Course

David T. Oliphant* Dec. 2000 Characterization of Uranium, Uranium Oxide and Silicon Multilayer Thin Films

Sterling W. Cornaby* June 2000 Using a Charged-Coupling Device (CCD) to Gather X-ray Fluorescence (XRF) and X-ray Diffraction (XRD) Information Simultaneously

David Rich Miller* April 1998 A Simulation of Synthetic Aperture Stellar Interferometry Using Post Acquisition Time Correlation

Pavel Brovkin April 1998 The Physics of Low-Capacitance JFETs

Bryan Royce Olsen* Dec. 1996 High Voltage Pulse Generator For A Capillary Discharge X-ray Laser

Cheryl Barnett Davis Dec. 1991 Deep-Level Photoluminescence of Zn_xCd_1-xTe

Honors Theses (dos copies are available on some from allred@byu.edu)

Amy Grigg June 2007 Oxidation Effects on the Optical Constants of Heavy Metals in the Extreme Ultraviolet (Allred reader) Presentation

Jacqualine Dee Jackson April 2007 Determining the Refractive Index of Scandium Oxide in the EUV Using Kramers-Kronig on Thin-Film Transmission Data.pdf. ppt

S. Andrew Ning June 2006 Creation Of An Intermediate Environment And Utilizing Switchable Microwave Absorbent Material To Aid In Performing Work On Mars. Draft: Word

William R. Evans Sept. 2005 Determining Optical Constants for ThO₂ Thin Films Sputtered under Different Bias Voltages from 1.2 To 6.5 eV by Spectroscopic Ellipsometry pdf word presentation

Nichol Farnsworth* March 2005 Thorium-based Mirrors in the Extreme Ultraviolet

Richard L. Sandberg June 2004 Optical Application of Uranium Thin Film Compounds for the Extreme Ultraviolet and Soft X-Ray Region

Jedediah E.J. Johnson June 2004 Thorium Based Mirrors for High Reflectivity in the EUV. Word

Joseph S. Choi June 2000 In Situ Ellipsometry of Surfaces in an Ultrahigh Vacuum Thin Film Deposition Chamber. (Fig. separately) Presentation. Main fig. Appendix own right

Steven L. Tait, Jr.* June 2000 A Comparative Study of Various Display Formats of Speech Frequency Spectra to Aid Lip Readers

Shannon Lunt* March 1999 The Use of Genetic Algorithms in Multilayer Mirror Optimization

Matthew B. Squires March 1999 On Determining the Optical Constants of Sputtered U and a-Si at 304 and 584 Å

Adam Fennimore Feb. 1998 Morphology and Oxidation of U/AI and UN/Al Multilayer Mirrors

Senior Theses

Alison Wells Aug. 2011 Determining The Cause Of Metal Oxide Film Growth Due To Exposure To Vacuum Ultraviolet Light

Devon Mortensen Aug. 2010 Determining The Cause Of Yttria Film Growth Due To Exposure To Vacuum-Ultraviolet Light

Jonathon A. Brame April 2009 Selectively Grown Silicon NanoWires for Transistor Devices

Elisabeth Strein Aug 2008 Studying and Eliminating Adventitious Carbon Contamination on Silicon Wafers

Michael Rasmussen April 2008 Vacuum Ultraviolet Photo-oxidation of Carbon Nanotubes

Elise Martin April 2007 Surface Roughness Correction to Extreme Ultraviolet Thin Film Reflectance Measurements (Allred reader)

Luke Bissell Aug 2004 Determining Ruthenium’s Optical Constants in the Spectral Range 11-14 nm

P. Douglas Archer June 2004 Determining Favorable Environments for Endolithic Growth: UV considerations.

Kristi R. Adamson April 2004 Determining Chemical Composition of Sputtered Uranium Oxide Thin Films through X-Ray Photoelectron Spectroscopy

Marie K. Urry* Dec. 2003 Determining Optical Constants of Uranium Nitride Thin Films in the Extreme Ultraviolet (1.6-35 nm)

Ross Robinson Aug. 15, 2003 Removing contaminants from silicon wafers to facilitate EUV Optical Characterization.

Ryan Camacho May 2003 Microstructural Analysis of Copper Thin Films for Characterization of Stress-Induced Voiding Mechanisms

Raymond Rios* Aug. 15, 2003 Developing a Polarimeter to Determine the Optical Constants of Materials in the XUV

Cort Johnson April 2001 Developing an Improved Extreme Ultraviolet Filter

Gregory Thompson June 1996 Reactive Gas Sputtering of Lithium Compound Thin Films

Senior Capstone Projects

Bryan Hicks April 2008 Diode Properties of Nanotube Networks

Robert Gillis April 2007 Determining the Extreme Ultraviolet Constants of Thoria by
Spectral Ellipsometry.

Nicholas Webb Nov. 2004 The Oxidation Rates of Vanadium

Yenny N. Martinez May 2002 Studying the Optical Properties of the NPD Mirrors

GRANTS: COMPLETE LIST LAST 1999-2007

“Evaluation and removal of peelcoat layers.” Stewart Observatory, May-Sept. 05 (R0802009)

“NIST Summer Undergraduate Research Fellowship Program,” (Cooperative Agreement #70NANB5H1074) May-Sept. 05. Student Jacque Jackson to NIST

“Computer Support for Doctoral Research: Guillermo Acosta,” Subaward # KMD5273-1-1/SUB; Prime # HRDO114712; Minority Graduate Education at Mountain State Alliance ASU; Jan. 20, 2005-Jan. 19, 2006.

“Thin film Si-Ge allys,” Lockheed-Martin, July –Dec. 2004

The most recent WAESO are:

“Mirror for the ESA Venus Express Spacecraft,” #S2004UR0081, WAESO, 2004

“Oxidation rates of very thin copper films,” #S03UR002 WAESO, 2003.

“Determining the optical properties of materials for making EUV multilayer reflectors,” Project #S02UR014, 2002.

“A polarimeter for determining the optical properties of materials for making EUV multilayer reflectors,” # V02UR017, summer 2002

Principle investigator for a two-year project to prepare a set of three EUV mirrors for the IMAGE mission which was launch March 25, 2000. MARATHON

PRESENTATIONS OF THE EUV GROUP (reverse chronological order) 2002- PRESENT (partial list)

2011

Annual Meeting of the Four-Corners Section of the American Physical Society October 21-22, 2011, The University of Arizona, Tucson, AZ abs. Richard S. Hansen et al, and Brett Barstrom

Colloquium for the Departments of Materials Science and Engineering and Metallurgy, Univ. of Utah Oct, 5, 2011, "EUV Optics and the Incredibly Expanding Film."

Technologies for Future Micro-Nano Manufacturing, August 8 - 10, 2011, Silverado Resort & Spa, Napa, CA USA, “Carbon Nanotube Templated Microfabrication of High-Aspect-Ratio Metal Structures,” David McKenna, Richard Hansen, Brian D. Jensen, Richard R. Vanfleet, Robert C. Davis, and David D. Allred.

103^r^d Annual Meeting of the Utah Academy of Science, Arts and Letters, Salt Lake Community College, Salt. Lake City, April 8, 2011, Students: ABS and ppt, Program

25th Annual Spring Research Conference of the College of Physical and Mathematical Sciences, BYU, Sat. March 19, 2011, Provo, UT. Presentations by students of Allred & R. Steven Turley:

Colloquium for Honors. University Rover Challenge, BYU Thursday 10 Feb. 2011 ppt

Colloquium for Department of Chemical Engineering, Brigham Young University, Jan. 13. 2011, Provo UT, Applications of carbon nanotubes, David D. Allred

2010

American Vacuum Society, 57th Annual International Symposium, October 17-22, 2010, Albuquerque NM, abstracts

Annual Meeting of the Four-Corners Section of the American Physical Society October 15-16, 2010, Weber State University, Ogden Utah Program

13th International Conference of the Mars Society, Friday Aug.5-8, 2010, Dayton OH

Hilton Head Workshop 2010: 12th Solid-State Sensors, Actuators and Microsystems Workshop, Sponsored by the
Transducer Research Foundation, Inc, Hilton-Head Crowne Plaza Resort 130 Shipyard Drive Hilton Head Island, SC, June 6-10, 2010. abs Open poster

16th Annual Rocky Mountain NASA Space Grant Consortium Fellowship Symposium, Salt Lake Community College, UT, May 10, 2010; Adam Konneker for Nicholas Morrill

2010 Annual Meeting of the Idaho-Utah Section of the American Association of Physics Teachers. & Saturday April 30, 2010 at Idaho State University in Pocatello, ID David Allred. ABS ppt

102^nd Annual Meeting of the Utah Academy of Science, Arts and Letters, Dixie State College, St. George, April 9, 2010, Students: ABS and ppt, Program

24th Annual Spring Research Conference of the College of Physical and Mathematical Sciences, BYU, Sat. March 20, 2010, Provo, UT. 4 presentations by students of Allred & R. Steven Turley: (two won outstanding papers in their s

Colloquium for Department of Physics and Astronomy, Utah Valley State University, March, 3 2010, Orem UT, Applications of carbon nanotubes, David D. Allred pdf

2009

15th Annual Rocky Mountain NASA Space Grant Consortium Fellowship Symposium, Salt Lake Community College, UT, May, 4, 2009; Joseph Muhlestein, "The Index of Refraction of Y2O3 in the Extreme Ultraviolet"

101^st Annual Meeting of the Utah Academy of Science, Arts and Letters, BYU, Provo April 10, 2009, Student: Jon Brame, "Selective Growth of Silicon Nanowires for Transistor Devices" (also Nathan Woods(BYU) and Dr. S. A. Getty (NASA GSFC)

2009 Annual Meeting of the Idaho-Utah Section of the American Association of Physics Teachers. March 27 & Saturday March 28, 2009 at Brigham Young University in Provo, UT David Allred. ABS ppt

23rd Annual Spring Research Conference of the College of Physical and Mathematical Sciences, BYU, Sat. March 21, 2009, Provo, UT. 4 presentations by students of Allred & R. Steven Turley: (t

o won outstanding papers in their sessions)

2008

Microstructured Vertically Aligned Carbon Nanotube Composites, at GSFC, Greenbelt MD, Thursday, December 18, 2008, at 11:00am in Building 30 conference room (183) Prof. David Allred, BYU. Talk was based on talk of Robert C. Davis, BYU
Annual Meeting of the Four-Corners Section of the American Physical Society October 17-18, 2008,12^th, at the University of Texas El Paso, TX, program, Group talks ms doc version
Posters for Homecoming: October 10, 2008, Jon Brame Thomas McConkie
International Conference of the Mars Society, Friday Aug. 14-17, 2008, Boulder Co
Microscopy & Microanalysis 2008 NM Aug. 3-7 2008, Use of a commercial RF Plasma Cleaner in eliminating adventitious carbon contamination in an XPS system, Elisabeth Strein. abs poster.
14th ICSFS 2008 Conference > 29 June-04 July, Dublin, Ireland > www.icsfs.ie, Preparation, Storage, Characterization and Use of Bilayer Reflectance Standards for VUV and EUV Optics, abs ppt.
14th Annual Rocky Mountain NASA Space Grant Consortium Fellowship Symposium, Salt Lake Community College, UT, May, 5, 2008
35th International Conference on Metallurgical Coatings & Thin Films, April 28-May 2, 2008, San Diego, CA program titles
51st SVC Annual Technical Conference April 19-24, 2008, Hyatt Regency Chicago, Chicago IL. www.svc.org, 2 presentations, G. A. Acosta and E. Strein. Both in Proceedings.
2008 Material Research Society Spring Meeting, March 24 - 28, 2008, Moscone West and San Francisco Marriott, Vacuum Ultraviolet Photo-oxidation of Carbon Nanotubes M. R. Rasmussen, D. D. Allred Wednesday Poster Abs
2008 Annual Meeting of the Idaho-Utah Section of the American Association of Physics Teachers. March 28 & Saturday March 29, 2008 at Boise State University in Nampa, ID Cluster Ballooning Exam Questions, David Allred. ABS ppt
100^th Annual Meeting of the Utah Academy of Science, Arts and Letters, U of Utah, SLC, March 21, 2008, Students: ABS Program
APS
22nd Annual Spring Research Conference of the College of Physical and Mathematical Sciences, BYU, Sat. March 15, 2008, Provo, UT. 4 presentations by students of Allred & R. Steven Turley: (two won outstanding papers in their sessions)

2007

2007 Material Research Society Fall Meeting, November 26 - 30, Boston, MA Hynes Convention Center, Symposium II: Nanotubes and Related Nanostructures, SESSION II15: Poster Session: Physical Properties and Devices, Wednesday Evening, November 28, 2007 abstracts, PPT.

Annual Meeting of the Four-Corners Section of the American Physical Society October 19-20, 2007, Northern Arizona University, Flagstaff, AZ; talks

Homecoming Posters: Single Walled Carbon Nanotube Magnetometer for Planetary Exploration, John Brame

Physics 191: Sept. 12, 2007 Space Instruments

10^th International Conference of the Mars Society, Friday Aug.31, 2007, Los Angeles, CA Experience of BYU team at the 2007 University Rover Challenge, Abs. Word

Optical Interference Coatings: Topical Meeting and Tabletop Exhibit June 3-8, 2007 Loews Ventana Canyon Resort and Spa Tucson, Arizona; Reflecting at 30.4 and Antireflecting at 58.4 nm, David D. Allred and R. Steven Turley abs. pdf

13th Annual Rocky Mountain NASA Space Grant Consortium Fellowship Symposium, Salt Lake Community College, UT, May, 7, 2007

99^th Annual Meeting of the Utah Academy of Science, Arts and Letters, SUU Cedar City, Utah April 13, 2007, students: Johnathan Goodsell, Bryan Hicks (for Jon Brame), Elise Martin and Sarah Barton.
Annual Meeting of the Idaho-Utah Section of the American Association of Physics Teachers. March 23 & Saturday March 24, 2007 at Utah State University in Logan, Utah, How BYU Students Did on the 2006 Physics GRE, David Allred abs

45^th AAS Robert H. Goddard Memorial Symposium: March 20-21,2007, The Inn and Conference Center by Marriott in Adelphi, Maryland. Poster. Strain-based Electrical Properties of Systems of Carbon Nanotubes Embedded in Parylene. Jon A. Brame, Johnathan Goodsell, Stephanie A. Getty and David Dean Allred;

NASA Headquarters ESMD (Exploration Systems Mission Directorate), Washington, DC, March 19, 2007 Lunch talk. On the Goddard-BYU Collaboration to Prepare Nanocompasses Based on SWCNT. Stephanie A. Getty, Jon Brame and David D. Allred.

21st Annual Spring Research Conference of the College of Physical and Mathematical Sciences, BYU, Sat. March 17, 2007, Provo, UT. 4 presentations by students of Allred & R. Steven Turley: (Brame, Jon; Grigg, Amy; Martin, Elise; and Barton, Sarah )

American Physical Society, Denver Co Tues March 6, 2007 H23.00014 Scandium Oxide Thin Films and Their Optical Properties in the EUV, Guillermo Acosta, David Allred, Steve Turley and Richard Vanfleet

Colloquium at UVSC, Orem UT 21 Feb. 2007.Optical Constants of Sputtered Thoria Thin Films Useful in EUV Optics from IR to EUV, David Allred

2006

2006 Material Research Society Fall Meeting, November 27 - December 1, Boston, MA Hynes Convention Center. Symposium Q: Nanowires and Carbon Nanotubes -- Science and Applications, SESSION Q20: Poster Session: Thermal, Optical and Mechanical Properties and Applications: Biological Interactions, Thursday Evening, November 30, 2006.

Q20.18 Strain-based Electrical Properties of Systems of Carbon Nanotubes Embedded in Parylene. Jon A. Brame, Johnathan Goodsell, Stephanie A. Getty and David Dean Allred; (Getty is a staff scientist at the Materials Engineering Branch, Code 541, NASA -- Goddard Space Flight Center, Greenbelt, Maryland.) abs, end of summer presentation

Q20.61 A Single-walled Carbon Nanotube-based Nanocompass for High Spatial Resolution Magnetometry. Stephanie A Getty, Jonathon A Brame, Johnathan E Goodsell, Melissa A Harrison, Gunther Kletetschka and David D Allred.

America Vacuum Society 53^rd Annual Meeting on November 13, 2006, Convention Center, SF, CA, Session Title: Surface Science Poster Session,

What is the Band Gap of Thoria?, W. R. Evans, S. C. Barton, D. D. Allred, and T. E. Tiwald, Abstract Number: 1181, Program Number: SS-ThP4 ( Thursday November 16, 2006, 5:30 PM)

BYU Astronomical Society, Planetarium Show. Oct. 13, 2006, Mars

Annual Meeting of the Four-Corners Section of the American Physical Society October 6-7, 2006 [Meeting ID: 4CF06] Utah State University, Logan, UT http://meetings.aps.org/Meeting/4CF06/Event/55727

Surface Contamination and Oxidation on Thin Films, poster presented by Liz Strein and Amy Grigg

http://meetings.aps.org/Meeting/4CF06/Event/55727

America Vacuum Society Rocky Mt. Section on Sept. 21, Colorado School of Mines, Golden, Colorado, 2006,

Surface Contamination and Oxidation on Thin Films, poster Liz Strein and Amy Grigg

51^st Annual Meeting, SPIE, Aug. 14-16, San Diego, CA. Advances In X-Ray/EUV Optics, Components, And Applications SESSION 7-8, Conv. Ctr. Room 17B Wed. Optical Constants and Measurement Technique,

9:00 am: Using reflection from coated diodes to help determine optical constants, D. D. Allred, G. Acosta, N. F. Brimhall, J. Johnson, D. Muhlestein, R. S. Turley, Brigham Young Univ. [6317-33]

9:20 am: Construction of an extreme ultraviolet polarimeter based on high-order harmonic generation, N. F. Brimhall, A. Baker, R. S. Turley, J. Peatross, Brigham Young Univ. [6317-34]

10:30 am: Thorium-based mirrors in the extreme ultraviolet, N. F. Brimhall, E. Martin, R. S. Turley, Brigham Young Univ. [6317-36]

10:50 am: Using spectroscopic ellipsometry (1.2 to 6.5 eV), AFM, and XRD to understand bias sputtered Thoria thin films, W. R. Evans, S. C. Barton, M. Clemens, D. D. Allred, Brigham Young Univ. [6317-37]

9^th International Conference of the Mars Society, Friday Aug. 3-6, 2006, Washington, DC

Intermediate Martian Atmospheric Study and Demonstration, Donovan Chipman, Andrew Ning, and David Allred, abs.

The 9th International Conference on Space Operations hosted by the Italian Space Agency (ASI), 19-23 June 2006 in Rome, Italy, Session 68- ME-25, Intermediate Martian Atmospheric Demonstrator, Donovan Chipman, Abs. PPT

12th Annual Rocky Mountain NASA Space Grant Consortium Fellowship Symposium, Salt Lake Community College, UT, May, 8, 2006

International Conference on Metallurgical Coatings & Thin Films, May 1-5, 2006, San Diego, CA

Determining Optical Constants for ThO₂ Thin Films Sputtered Under Different Bias Voltages from 1.2 To 6.5 eV by Spectroscopic Ellipsometry, William R. Evans and David D. Allred. ppt

49^th SVC Technical Conference, April 24-28, 2006 in Washington DC

Simultaneous Reflection and Transmission Measurements of Scandium Oxide Thin Films in the Extreme Ultraviolet, G. Acosta, D. Allred, S. Turley, and N. Farnsworth. 9:10 a.m. Opt. Films, Tuesday apt. 27 @ 9:10

Utah Academy of Science, Arts and Letters, April 7, 2006, Ephraim, UT; Physical Sciences Division of the 2006 Utah Academy of Sciences, Arts, and Letters Meeting at Snow College,

Optical Constants for ThO₂ Thin Films from 1.2 to 6.5eV by Spectroscopic Ellipsometry, William R. Evans and David D. Allred.

Spectrally Tunable Light Source for Remote Ocean-Color Sensing, Jacque Jackson, Brigham Young University and Steven Brown, NIST, Gaithersburg, MD

Computationally Modeling the Effects of Surface Roughness on Extreme Ultraviolet MultilayerReflectors, Jedediah Johnson and R. Steven Turley,

Extending our Reach into the Extreme Ultraviolet Using a Grazing Incidence Monochromator, Sarah C. Barton ***

20^th Annual Spring Research Conference of the College of Physical and Mathematical Sciences, BYU, Sat. March 18, 2006, Provo, UT. 8 presentations by students of Allred & R. Steven Turley:

Colloquium for Department of Chemical Engineering, Brigham Young University, Feb. 9, 2005, Provo UT, Planetary Exploration Projects. David D. Allred.

2005

2005 Material Research Society Fall Meeting, November 28 - December 2, Boston, MA Hynes Convention Center.

Uranium & Thorium for EUV and Soft X-ray Optics, Jed E. Johnson, David D. Allred, R. Steven Turley, William R. Evans, & R. L. Sandberg

Physics 191: EUV Astronomy & Venus Express

Fourth International Extreme Ultra Violet Lithography (EUVL) Symposium 07-09 November 2005 San Diego, California

EUV Photodiodes with Directly Deposited Uranium Filter, by Raj Korde et al., poster presented by Raj Korde (International Radiation Detectors, Inc.) see also http://www.sematech.org/meetings/announcements/7470.htm

America Vacuum Society 52^nd Annual Meeting on November 3, 2005, Hynes Convention Center, Boston, MA

Thin Film Optical Constants in the EUV using Simultaneous Reflection and Transmission Measurements, D.D. Allred, G.A. Acosta, R.S. Turley, J.E. Johnson, K.R. Adamson, presented by G.A. Acosta Thursday, November 3, 2005, 11:40am, Room 306. abs.

Annual Meeting of the Four-Corners Section of the American Physical Society at University of Colorado, October 14-15, 2005, Boulder CO

Spectrally Tunable Light Source for Remote Ocean Color Sensing, Jacqualine Jackson 25 MB

X-ray Photoelectron Spectroscopy to Examine Molecular Composition, Amy Baker, Best presentation award.

8^th International Conference of the Mars Society, Friday Aug. 11-14, 2005, Boulder, CO

Green thumbs for the red planet. Kyrstle Farnsworth, Nichole F. Brimhall, Jacque Jackson, and David D. Allred, Presented by Krystle

An Intermediate Environment for Mars Exploration, Andrew Ning. Manuscript for proceedings.

Summer Meeting of the AAPT, Salt Lake City, UT, August 6-10, 2005

Physical Characterization of EUV Mirrors Using the Pearson Correlation Coefficient, Nathaniel Powell, Steve Turley, David D Allred, and David Oliphant

Optical Constants for ThO₂ Films Sputtered Under Different Bias Voltages, William Evans, David D Allred

Surface Roughness of Thorium Based Mirrors in the Extreme Ultraviolet, Marian D Harrison, Niki Farnsworth, and Steve Turley

11th Annual Rocky Mountain NASA Space Grant Consortium Fellowship Symposium, Salt Lake Community College, Salt Lake City, UT, May, 9, 2005

A New Technique for the Measurement of Thin Films in the Extreme Ultraviolet: Simultaneous Collection of Reflection and Transmission, Guillermo Acosta, David D. Allred

Advantages of a Grazing Incidence Monochromator in the Extreme Ultraviolet, Sarah Barton, Steven Turley (Poster Session)

Optical Properties of Reactivity Sputtered ThO₂ Thin Films for EUV Applications, William Evans, David D. Allred, Steven Turley (Poster Session)

Green Thumbs for the Red Planet, Nicole Farnsworth, David D. Allred (Poster Session)

Model of Atomic Level Roughness, Marian Harrison, Steven Turley (Poster Session)

Physical Characteristic of X-Ray and EUV Mirrors using the Pearson Correlation Coefficient, Nathan Powell, Steven Turley (Poster Session)

48th SVC Technical Conference, April 24-48, 2005 in Denver, CO

A Technique for Measuring the Thin Film Thickness of Ultrathin Metallic Thin Films, 4-20 nm, using Atomic Force Microscopy, G. Acosta, Poster Session on April 25, 2005.

Experimental Determination of Scandium Thin Film Optical Constants from 10-1000 nm, G. Acosta, D.D. Allred

Utah Academy of Science, Arts and Letters, April 15, 2005, Orem, UT

Characterizing Reactively Sputtered ThO₂ Films for EUV Applications, William R. Evans, Amy Baker, and D.D. Allred; Christian Contreras-Campana (Mt. San Antonio College)-BYU REU 2004

Surface Roughness of Thorium and Thorium Oxide and its Effect on Optical Properties in the Extreme Ultraviolet, Nichole Farnsworth, R. Steven Turley; Christian Contreras-Campana (Mt. San Antonio College)-BYU REU 2004

Modeling Surface Roughness, Marian Harrison, R. Steven Turley

Determining the Optical Constants of Thorium Oxide Thin Films in the EUV from Reflection and Transmission Measurements, Jedediah Johnson, Guillermo Acosta, Elise Martin, David Muhlestein, Nichole Farnsworth, David D. Allred, R. Steven Turley

Cleaning Silicon Wafers with CO₂ Snow Jet, Andrew Jacquier, William Evans, David D. Allred

Advantages of a Grazing Incidence Monochromator in the UV, Sarah Barton

Miller on Mars, Anne Potter, Sarah Barton, Tiffany Brown, Nichole Farnsworth, Amy Baker, Matt Christensen, David D. Allred, Gary Booth

Green Thumbs for the Red Planet, Jacque Jackson, Nichole Farnsworth, David D. Allred

Creation of “Intermediate Environments” and Other Aids in the Exploration of Mars, Krystle Farnsworth, S. Andrew Ning, Rob Gillis, Brian Riddle, David D. Allred

19^th Annual Spring Research Conference of the College of Physical and Mathematical Sciences, BYU, March 19, 2005, Provo, UT. 13 presentations by students of Allred & R. Steven Turley:

Experimental determination of scandium thin film optical constants, from 10-1000 nm; Guillermo Acosta, David D. Allred,

Molecular Composition as Examined by X-ray Photoelectron Spectroscopy, Amy Baker, R. Steven Turley. Presentation

Advantages of a Grazing Incidence Monochromator in the Ultra-Violet, Sarah Barton, R. Steven Turley. Presentation

Small Photons, Big Atoms, and Things that go “Bump” in the Dark: Or Ellipsometric Determination of Visible Wavelength Optical Constants for Thorium Dioxide Thin Films Deposited Under Different Bias Voltages, William R. Evans, David D. Allred. Presentation

Surface Roughness of Thorium and Thorium Oxide and its Effect on Optical Properties in the Extreme Ultraviolet Nicole Farnsworth, R. Steven Turley; Presentation

Model of Atomic Level Roughness, Marian Harrison, R. Steven Turley Presentation

Green Thumbs for the Red Planet, Jacque Jackson, David D. Allred, Nicole Farnsworth. Presentation

Silicon Wafer Cleaning for EUV Reflectance measurements by cold, high-pressure CO₂ jet, Andrew Jacquier, David D. Allred. Presentation

Highly Reflective Thorium-Based Mirrors, Jedediah Johnson, David D. Allred. Presentation

Thorium Dioxide Thin Films in the Extreme Ultraviolet, Elise Martin, & David Muhlestein, R. Steven Turley Presentation

Improved Extra Vehicular Activity by use of a Pressurized Martian Atmosphere, Andrew Ning, David D. Allred Presentation

Miller on Mars, Anne Potter, David D. Allred Presentation