AVS 2010 Titles, Abstracts and link to presentations
(Poster) Spectroscopic Ellipsometry Focus Topic Poster Session Analysis of
Anomalous Film Growth when Yttrium Oxide Thin Films are Exposed to 7.2eV Light.
4525 EUV and in situ Spectroscopic Ellipsometric Analysis of the Oxidation of Uranium Thin Films
4568 MN-ThP11 (Poster) Modeling of Diffusion, Nucleation and Growth in the Chemical Vapor Infiltration of Vertically-Aligned Carbon Nanotube Forests for MEMS.