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Roughness Correction Model For Reflection From Perfectly Conducting Scatterers

Student Name: Doughty, W. Todd
Advisor Name: Turley, R. Steven
Approval Date: 8/1/2008
Report Type: Senior Thesis
Title: Roughness Correction Model For Reflection From Perfectly Conducting Scatterers
Abstract: I modeled the re ectance from rough conductive surfaces for tranverse magnetic (TM) and tranverse electric (TE) polarization. The Nystrom technique was applied in order to solve the Electric Field Integral Equation (EFIE) in the TM case and the Magnetic Field Integral Equation (MFIE) in the TE case. We studied 2.4 million sample surfaces with varied roughness heights and frequencies from various incident angles and compared the results to the predictions of the Debye-Waller Factor (DWF). As predicted, the attenuation is directly correlated with the qh factor, but di ers from the DWF in both form and magnitude. There was also a signi cant dependance on both spatial frequency and polarization. We developed our own model by tting the results to a cubic correction function. In addition to the predicted quadratic term, our simulations showed signi cant linear and cubic terms in the roughness correction function.
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