| Abstract: |
We have used the technique of coherent X-ray Resonant Magnetic Scattering (XRMS) to probe the magnetic domain morphologies in a ([Co/Pd]12IrMn)4 exchange bias thin lm. When illuminated by coherent light, the thin lm produces specic speckle patterns that reveal information about the local magnetic domain topology in the sample. After subjecting the sample to a variable magnetic eld and collecting XRMS patterns, we have analyzed the amount of magnetic memory within the sample by employing a cross-correlation approach. Results indicate that, at low temperature, the sample shows very high magnetic memory in the coercive region of the magnetization cycle. In particular, the system exhibits strong return point memory (RPM) and conjugate point memory (CPM). The dependency of RPM and CPM on applied eld will be presented rst in a 1D and then in a 2D eld analysis showing that the magnetic memory stays stable within the coercive region of the magnetization. |