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Gst Crystallite-Density Tem-Analysis Finds No Crystalline Structure

Student Name: Johnson, Christopher
Advisor Name: Vanfleet, Richard
Approval Date: 10/1/2009
Report Type: Capstone
Title: Gst Crystallite-Density Tem-Analysis Finds No Crystalline Structure
Abstract: TEM analysis techniques: high resolution, bright-field and dark-field imaging; electron diffraction, and STEM showed crystallite area density in a sputtered GST (GexSbyTez) thin film to be less than one crystallite per 0.0527 μm2, which restated is less than 19 crystalites/μm2 . Beyond the quantified data, a qualitative search of the sample failed to find any crystallites.
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