| Abstract: |
TEM analysis techniques: high resolution, bright-field and dark-field imaging; electron diffraction, and STEM showed crystallite area density in a sputtered GST (GexSbyTez) thin film to be less than one crystallite per 0.0527 μm2, which restated is less than 19 crystalites/μm2 . Beyond the quantified data, a qualitative search of the sample failed to find any crystallites. |